JCID V1SE/V1S PRO SIM Card Holder Testing Set

JCID V1SE/V1S PRO SIM Card Holder Testing Set

JCID – SIM/TF Socket Testing Set (iPhone 5–16PM + Android)

JCID SIM/TF Testing Set is a professional service kit designed for quick and precise diagnostics of SIM and TF (microSD) slots. Thanks to its one-key quick detection feature, it allows for instant fault detection without the need to disassemble the phone.

The kit is compatible with JCID V1S Pro / V1SE, supports iPhone 5–16 PM (single and dual SIM, including the 15 and 16 series with an ultra-thin slot), and Android devices with SIM and TF card slots. ENIG technology guarantees durability, and intelligent security protects against damage during testing.

This is an indispensable tool for GSM and electronics repair shops that value speed, security, and broad compatibility.

zł189.99
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Description

JCID – SIM/TF Slot Test Kit (iPhone 5-16PM + Android)

Professional service kit for quick testing of SIM and TF (microSD) slots without disassembling the phone. Works with JCID V1S Pro / V1SE, supports iOS single/dual SIM, as well as Android SIM + TF. Perfect for verification after modifications and repairs – one click, clear result, full control.


Fast one-button detection – plug & play play, without unnecessary steps (V1SE/V1S Pro).

The JCID kit is designed for express diagnostics of SIM/TF card slots in Apple and Android devices. The graphical interface of the V1S Pro / V1SE devices presents results in a clear manner and corresponds to the actual contacts in the socket, which minimizes the risk of misinterpretation and speeds up service work.

Key Advantages

  • One-key quick detection

    One-button test, without disassembling the device – plug & play.

  • Precise probe positioning

    The results on the screen correspond to the pinout in the socket – fast, efficient, and intuitive.

  • Two operating modes

    Test without disassembly (diode value measurement) and test at startup (SIM function check).

  • Wide compatibility

    iPhone 5–16 PM (including 11/12/13/14/15/16, 16/16Plus, 16 Pro/Max series) and Android (SIM + TF/microSD).

  • Security and durability

    ENIG (Electroless Nickel / Immersion Gold) technology plates – high resistance to wear and bending; FPC interface protection, no risk of "burning" if the card is inserted backwards.

  • Clear LED indications

    LED on – reading OK; LED flashing – reading in progress; LED off – error or missing card. 5G support.


Precise probe positioning and compliance with the pinout in the card slot.

Operating modes and usage

Non-disassembly mode – turn off the phone, connect the adapter to the V1S Pro / V1SE and measure the diode value without opening the device.
Boot Mode – during system startup, you can check the single/dual SIM functions (in Android, also the TF card slot/extension card).


Test without disassembly (diode measurement) and test during startup (SIM function verification).

Wide Compatibility

The set includes dedicated adapters: iOS Single SIM, iOS Dual SIM, and 16/16 Plus. Supported devices include: iPhone 5–8P, X/XS, XR/XS Max, 11/12/13/14/15 series, 16/16 Plus, 16 Pro/16 Pro Max, as well as Android devices (SIM + TF).


Dedicated adapters for iOS Single/Dual SIM and iPhone 16/16 Plus.

Set Contents

  • SIM Card Holder Testing Adapter V1.0
  • iOS Dual SIM Card Connection Adapter
  • iOS Single SIM Card Connection Adapter
  • 16/16Plus SIM Card Connection Adapter
  • SIM Card Holder – TF Card Holder FPC V1.0
  • SIM Card Holder Connection FPC V1.0

Specification

Name JCID – SIM/TF slot testing kit
Application iPhone 5–16PM + Android (Supports SIM + TF card slot detection after update)
iOS Compatibility Single SIM, Dual SIM; including 11/12/13/14/15/16 series, 16/16Plus, 16 Pro/Max
Android Compatibility SIM + TF (microSD); including 3-slot systems (Long/Short)
Materials/Technology ENIG (Electroless Nickel / Immersion Gold) circuit boards – high durability and bending resistance
Additional Features LED Status Indicators; Probe Position Scan; FPC Interface Protection; 5G Support
Required Device JCID V1S Pro / V1SE
Update Information V1S Pro – feature available from version V2.15 (07.11.2024); V1SE – planned implementation before 15.12.2024
Brand JCID
Tips:
  • LED steady on – reading OK; blinking – reading in progress; off – error or missing card.
  • After modifying the socket in the iPhone 15 series, the kit provides stable verification of correctness.
Product Details
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